doc. no : qw0905- rev. : a date : luy13430r/s15-pf luy13430r/s15-pf data sheet super bright oval type led lamps pb lead-free parts ligitek electronics co.,ltd. property of ligitek only 12 - jun. - 2007
radiation angle(0.5):h 90 degree/v 68 degree 25% vertical axis 68 note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 100% 50% 75% 25% 0 directivity radiation horizontal axis 90 -60 -30 0 100% 75% 50% 60 30 ligitek electronics co.,ltd. property of ligitek only package dimensions luy13430r/s15-pf part no. 1/5 page 5.0 4.31 7.4 10.5 0.5 6.5 0.5 2.54typ 0.5 typ + -
2/5 20 1.72.6 yellow algainp luy13430r/s15-pf yellow diffused color lens material part no emitted 1100 luminous intensity @20ma(mcd) typ. 20 spectral halfwidth nm 590 dominant wave length dnm max. forward voltage @ ma(v) min. 700 min. viewing angle 2 1/2 (deg) page ligitek electronics co.,ltd. property of ligitek only unit ma ma a v mw 50 90 uy(r) ratings 10 2000 ir -40 ~ +85 -40 ~ +100 120 forward current peak forward current duty 1/10@10khz parameter operating temperature storage temperature electrostatic discharge( * ) reverse current @5v power dissipation typical electrical & optical characteristics (ta=25 ) symbol esd t opr tstg i f pd i fp absolute maximum ratings at ta=25 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * luy13430r/s15-pf part no. vertical axis 68 horizontal axis 90
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 luminous intensity vs. temperature ambient temperature( ) l u m i n o u s i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) l u m i n o u s i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 0 0 50 100 150 050100150 0.0 1.0 2.0 3.0 -40-200204060 0.51.01.52.0 80100 0.94 -20 -4040 20 080100 60 0.0 0.5 1.5 1.0 uyr chip page 3/5 fig.2 luminous intensity vs. forward current 5.0 4.0 2.53.0 0.96 0.98 1.00 1.02 1.04 1.06 500 0.0 0.5 550 600 650 1.0 luy13430r/s15-pf part no.
note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 0 0 preheat 50 100 time(sec) 150 25 120 2 /sec max temp( c) 260 5 /sec max 260 c3sec max dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 2.wave soldering profile soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) ligitek electronics co.,ltd. property of ligitek only page 4/5 luy13430r/s15-pf part no.
jis c 7021: b-12 low temperature storage test the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=230 5 2.dwell time=5 1sec solderability test high temperature high humidity test thermal shock test 1.t.sol=260 5 2.dwell time= 10 1sec. solder resistance test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 this test intended to see soldering well performed or not. mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. the purpose of this test is the resistance of the device under tropical for hours. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) reliability test: operating life test high temperature storage test test itemtest condition mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. description mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only page 5/5 luy13430r/s15-pf part no.
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